Determination of the inelastic mean-free-path and mean inner potential for AlAs and GaAs using off-axis electron holography and convergent beam electron diffraction

Microscopy and Microanalysis

Volumn 13, Issue 5, 2007, Pages 329-335

  Chung, Suk ^a   Smith, David J ^a   McCartney, Martha R ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

AlAs; Electron holography; GaAs; Inelastic mean free path; Mean inner potential

Indexed keywords

EID: 34948880693     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927607070687     Document Type: Article

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