Nanoelectronics in radio-frequency technology

IEEE Microwave Magazine

Volumn 11, Issue 3, 2010, Pages 119-135

  Russer, Peter ^a   Fichtner, Nikolaus ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL EQUIPMENT; ATOMIC DIMENSION; DEVICE PROPERTIES; INTEGRATION DENSITY; MINIATURIZATION OF DEVICES; MULTIDISCIPLINARY PERSPECTIVES; NANO SCALE; NANO-DEVICES; NANO-MATERIALS; NANO-SCALE FABRICATION; NANOSCALE DIMENSIONS; NANOSCALE SCIENCE; RADIOFREQUENCY TECHNOLOGY;

NANOELECTRONICS;

NANOSTRUCTURED MATERIALS;

EID: 77951694539     PISSN: 15273342     EISSN: None     Source Type: Trade Journal    
DOI: 10.1109/MMM.2010.936077     Document Type: Article

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