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Volumn 9, Issue 7-8, 2006, Pages 20-27

Plasmonics: the next chip-scale technology

Author keywords

[No Author keywords available]

Indexed keywords

DATA PROCESSING; ELECTRONICS PACKAGING; METAL ANALYSIS; NANOSTRUCTURED MATERIALS;

EID: 33745230127     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(06)71572-3     Document Type: Article
Times cited : (809)

References (48)
  • 2
    • 0036048355 scopus 로고    scopus 로고
    • Impact of joule heating on scaling of deep sub-micron Cu/low-k interconnects
    • Chiang T.-Y., et al. Impact of joule heating on scaling of deep sub-micron Cu/low-k interconnects. IEEE Symp. VLSI Circuits, Dig. Tech. Papers 38 (2002)
    • (2002) IEEE Symp. VLSI Circuits, Dig. Tech. Papers , vol.38
    • Chiang, T.-Y.1
  • 6
    • 0042968726 scopus 로고    scopus 로고
    • Barnes W.L., et al. Nature 424 (2003) 824
    • (2003) Nature , vol.424 , pp. 824
    • Barnes, W.L.1
  • 8
    • 33745234525 scopus 로고    scopus 로고
    • [This reference contains the first occurrence of the word 'plasmonics' in title, subject, or abstract in the Inspec® database.]
    • Brongersma M.L., et al. Mater. Res. Soc. Symp. Proc. 502 (1999) H10.5 [This reference contains the first occurrence of the word 'plasmonics' in title, subject, or abstract in the Inspec® database.]
    • (1999) Mater. Res. Soc. Symp. Proc. , vol.502
    • Brongersma, M.L.1
  • 21
    • 28644440884 scopus 로고    scopus 로고
    • Zia R., et al. Phys. Rev. B 71 (2005) 165431
    • (2005) Phys. Rev. B , vol.71 , pp. 165431
    • Zia, R.1
  • 22
    • 20944445251 scopus 로고    scopus 로고
    • Zia R., et al. Opt. Lett. 30 (2005) 1473
    • (2005) Opt. Lett. , vol.30 , pp. 1473
    • Zia, R.1
  • 23
    • 33745231735 scopus 로고    scopus 로고
    • Zia, R., et al., unpublished results
  • 38
    • 0001749527 scopus 로고    scopus 로고
    • Lee K.K., et al. Opt. Lett. 26 (2001) 1888
    • (2001) Opt. Lett. , vol.26 , pp. 1888
    • Lee, K.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.