Radio-frequency single-electron transistor as readout device for qubits: Charge sensitivity and backaction

Physical Review Letters

Volumn 86, Issue 15, 2001, Pages 3376-3379

  Aassime, A ^a   Johansson, G ^a   Wendin, G ^a   Schoelkopf, R J ^b   Delsing, P ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b YALE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRIC POTENTIAL; ELECTRON BEAM LITHOGRAPHY; READOUT SYSTEMS; SHOT NOISE; TRANSISTORS;

SINGLE ELECTRON TRANSISTORS;

QUANTUM ELECTRONICS;

EID: 4243967192     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.3376     Document Type: Article

References (24)