RF properties of overdamped SIS junctions

IEEE Transactions on Applied Superconductivity

Volumn 15, Issue 2 PART I, 2005, Pages 114-116

  Lacquaniti, Vincenzo ^a   Cagliero, Chiara ^a   Maggi, Sabino ^a   Steni, Raffaella ^a   Andreone, Domenico ^a   Sosso, Andrea ^a  

^a ISTITUTO ELETTROTECNICO NAZIONALE GALILEO FERRARIS   (Italy)

Author keywords

Josephson junctions; Superconducting devices; Voltage standard

Indexed keywords

ALUMINUM; ALUMINUM COMPOUNDS; CRYOSTATS; CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; DIELECTRIC WAVEGUIDES; ELECTRIC POTENTIAL; IRRADIATION; NIOBIUM; SUPERCONDUCTING DEVICES;

LOW-RESISTANCE JUNCTIONS; METALLIC BARRIER JUNCTIONS; THIN OXIDE LAYERS; VOLTAGE STANDARD;

JOSEPHSON JUNCTION DEVICES;

EID: 22044437720     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.849707     Document Type: Conference Paper

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