-
1
-
-
5444275992
-
-
0268-1242. 10.1088/0268-1242/19/10/R02
-
D. J. Paul, Semicond. Sci. Technol. 0268-1242 19, R75 (2004). 10.1088/0268-1242/19/10/R02
-
(2004)
Semicond. Sci. Technol.
, vol.19
, pp. 75
-
-
Paul, D.J.1
-
3
-
-
34548268224
-
Observation of two-dimensional hole gas with mobility and carrier density exceeding those of two-dimensional electron gas at room temperature in the SiGe heterostructures
-
DOI 10.1063/1.2773744
-
M. Myronov, K. Sawano, Y. Shiraki, T. Mouri, and K. M. Itoh, Appl. Phys. Lett. 0003-6951 91, 082108 (2007). 10.1063/1.2773744 (Pubitemid 47318959)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.8
, pp. 082108
-
-
Myronov, M.1
Sawano, K.2
Shiraki, Y.3
Mouri, T.4
Itoh, K.M.5
-
4
-
-
27644529382
-
Compressive strain dependence of hole mobility in strained Ge channels
-
DOI 10.1063/1.2126114, 192102
-
K. Sawano, Y. Abe, H. Satoh, Y. Shiraki, and K. Nakagawa, Appl. Phys. Lett. 0003-6951 87, 192102 (2005). 10.1063/1.2126114 (Pubitemid 41567641)
-
(2005)
Applied Physics Letters
, vol.87
, Issue.19
, pp. 1-3
-
-
Sawano, K.1
Abe, Y.2
Satoh, H.3
Shiraki, Y.4
Nakagawa, K.5
-
5
-
-
0001279324
-
-
0003-6951. 10.1063/1.110547
-
Y. H. Xie, D. Monroe, E. A. Fitzgerald, P. J. Silverman, F. A. Thiel, and G. P. Watson, Appl. Phys. Lett. 0003-6951 63, 2263 (1993). 10.1063/1.110547
-
(1993)
Appl. Phys. Lett.
, vol.63
, pp. 2263
-
-
Xie, Y.H.1
Monroe, D.2
Fitzgerald, E.A.3
Silverman, P.J.4
Thiel, F.A.5
Watson, G.P.6
-
6
-
-
34248361121
-
Fabrication of thick SiGe on insulator (Si0.2 Ge0.8 OI) by condensation of SiGeSi superlattice grown on silicon on insulator
-
DOI 10.1063/1.2737818
-
S. Balakumar, S. Peng, K. M. Hoe, G. Q. Lo, R. Kumar, N. Balasubramanian, D. L. Kwong, Y. L. Foo, and S. Tripathy, Appl. Phys. Lett. 0003-6951 90, 192113 (2007). 10.1063/1.2737818 (Pubitemid 46738102)
-
(2007)
Applied Physics Letters
, vol.90
, Issue.19
, pp. 192113
-
-
Balakumar, S.1
Peng, S.2
Hoe, K.M.3
Lo, G.Q.4
Kumar, R.5
Balasubramanian, N.6
Kwong, D.L.7
Foo, Y.L.8
Tripathy, S.9
-
7
-
-
79956054779
-
Very high hole mobilities in modulation-doped Ge quantum wells grown by low-energy plasma enhanced chemical vapor deposition
-
DOI 10.1063/1.1470691
-
H. von Känel, M. Kummer, G. Isella, E. Müller, and T. Hackbarth, Appl. Phys. Lett. 0003-6951 80, 2922 (2002). 10.1063/1.1470691 (Pubitemid 34599199)
-
(2002)
Applied Physics Letters
, vol.80
, Issue.16
, pp. 2922
-
-
Von Kanel, H.1
Kummer, M.2
Isella, G.3
Muller, E.4
Hackbarth, T.5
-
10
-
-
56249107683
-
-
0003-6951. 10.1063/1.3023068
-
V. A. Shah, A. Dobbie, M. Myronov, D. J. F. Fulgoni, L. J. Nash, and D. R. Leadley, Appl. Phys. Lett. 0003-6951 93, 192103 (2008). 10.1063/1.3023068
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 192103
-
-
Shah, V.A.1
Dobbie, A.2
Myronov, M.3
Fulgoni, D.J.F.4
Nash, L.J.5
Leadley, D.R.6
-
11
-
-
33646372489
-
High-temperature growth of very high germanium content SiGe virtual substrates
-
DOI 10.1016/j.jcrysgro.2006.02.019, PII S0022024806001515
-
Y. Bogumilowicz, J. M. Hartmann, C. Di Nardo, P. Holliger, A. M. Papon, G. Rolland, and T. Billon, J. Cryst. Growth 0022-0248 290, 523 (2006). 10.1016/j.jcrysgro.2006.02.019 (Pubitemid 43673720)
-
(2006)
Journal of Crystal Growth
, vol.290
, Issue.2
, pp. 523-531
-
-
Bogumilowicz, Y.1
Hartmann, J.M.2
Di Nardo, C.3
Holliger, P.4
Papon, A.-M.5
Rolland, G.6
Billon, T.7
-
12
-
-
35348894965
-
Detection of Cs2 Ge+ clusters for the quantification of germanium atoms by secondary ion mass spectrometry: Application to the characterization of Si1-x Gex layers (0≤x≤1) and germanium diffusion in silicon
-
DOI 10.1063/1.2786037
-
M. Gavelle, E. Scheid, F. Cristiano, C. Armand, J. M. Hartmann, Y. Campidelli, A. Halimaoui, P. F. Fazzini, and O. Marcelot, J. Appl. Phys. 0021-8979 102, 074904 (2007). 10.1063/1.2786037 (Pubitemid 47587897)
-
(2007)
Journal of Applied Physics
, vol.102
, Issue.7
, pp. 074904
-
-
Gavelle, M.1
Scheid, E.2
Cristiano, F.3
Armand, C.4
Hartmann, J.-M.5
Campidelli, Y.6
Halimaoui, A.7
Fazzini, P.-F.8
Marcelot, O.9
-
13
-
-
3643130905
-
-
0031-9007. 10.1103/PhysRevLett.64.1943
-
D. J. Eaglesham and M. Cerullo, Phys. Rev. Lett. 0031-9007 64, 1943 (1990). 10.1103/PhysRevLett.64.1943
-
(1990)
Phys. Rev. Lett.
, vol.64
, pp. 1943
-
-
Eaglesham, D.J.1
Cerullo, M.2
-
14
-
-
0342708883
-
-
0031-9007. 10.1103/PhysRevLett.73.3006
-
Y. H. Xie, G. H. Gilmer, C. Roland, P. J. Silverman, S. K. Buratto, J. Y. Cheng, E. A. Fitzgerald, A. R. Kortan, S. Schuppler, M. A. Marcus, and P. H. Citrin, Phys. Rev. Lett. 0031-9007 73, 3006 (1994). 10.1103/PhysRevLett.73.3006
-
(1994)
Phys. Rev. Lett.
, vol.73
, pp. 3006
-
-
Xie, Y.H.1
Gilmer, G.H.2
Roland, C.3
Silverman, P.J.4
Buratto, S.K.5
Cheng, J.Y.6
Fitzgerald, E.A.7
Kortan, A.R.8
Schuppler, S.9
Marcus, M.A.10
Citrin, P.H.11
-
15
-
-
24644442190
-
High germanium content SiGe virtual substrates grown at high temperatures
-
DOI 10.1016/j.jcrysgro.2005.06.036, PII S0022024805007803
-
Y. Bogumilowicz, J. M. Hartmann, F. Laugier, G. Rolland, T. Billon, N. Cherkashin, and A. Claverie, J. Cryst. Growth 0022-0248 283, 346 (2005). 10.1016/j.jcrysgro.2005.06.036 (Pubitemid 41277187)
-
(2005)
Journal of Crystal Growth
, vol.283
, Issue.3-4
, pp. 346-355
-
-
Bogumilowicz, Y.1
Hartmann, J.M.2
Laugier, F.3
Rolland, G.4
Billon, T.5
Cherkashin, N.6
Claverie, A.7
-
16
-
-
0000059047
-
Controlling threading dislocation densities in Ge on Si using graded SiGe layers and chemical-mechanical polishing
-
DOI 10.1063/1.121162, PII S0003695198012145
-
M. T. Currie, S. B. Samavedam, T. A. Langdo, C. W. Leitz, and E. A. Fitzgerald, Appl. Phys. Lett. 0003-6951 72, 1718 (1998). 10.1063/1.121162 (Pubitemid 128671439)
-
(1998)
Applied Physics Letters
, vol.72
, Issue.14
, pp. 1718-1720
-
-
Currie, M.T.1
Samavedam, S.B.2
Langdo, T.A.3
Leitz, C.W.4
Fitzgerald, E.A.5
-
17
-
-
2342464199
-
-
1099-0062. 10.1149/1.1676116
-
S. W. Bedell, D. K. Sadana, K. Fogel, H. Chen, and A. Domenicucci, Electrochem. Solid-State Lett. 1099-0062 7, G105 (2004). 10.1149/1.1676116
-
(2004)
Electrochem. Solid-State Lett.
, vol.7
, pp. 105
-
-
Bedell, S.W.1
Sadana, D.K.2
Fogel, K.3
Chen, H.4
Domenicucci, A.5
-
18
-
-
0018439616
-
-
0013-4651. 10.1149/1.2129066
-
D. G. Schimmel, J. Electrochem. Soc. 0013-4651 126, 479 (1979). 10.1149/1.2129066
-
(1979)
J. Electrochem. Soc.
, vol.126
, pp. 479
-
-
Schimmel, D.G.1
-
19
-
-
0000807184
-
-
0003-6951. 10.1063/1.124762
-
J. L. Liu, C. D. Moore, G. D. U. Ren, Y. H. Luo, Y. Lu, G. Jin, S. G. Thomas, M. S. Goorsky, and K. L. Wang, Appl. Phys. Lett. 0003-6951 75, 1586 (1999). 10.1063/1.124762
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 1586
-
-
Liu, J.L.1
Moore, C.D.2
Ren, G.D.U.3
Luo, Y.H.4
Lu, Y.5
Jin, G.6
Thomas, S.G.7
Goorsky, M.S.8
Wang, K.L.9
-
21
-
-
0000652295
-
-
0003-6951. 10.1063/1.106532
-
D. P. Malta, J. B. Posthill, R. J. Markunas, and T. P. Humphreys, Appl. Phys. Lett. 0003-6951 60, 844 (1992). 10.1063/1.106532
-
(1992)
Appl. Phys. Lett.
, vol.60
, pp. 844
-
-
Malta, D.P.1
Posthill, J.B.2
Markunas, R.J.3
Humphreys, T.P.4
-
23
-
-
33845249448
-
Deviations from ideal nucleation-limited relaxation in high-Ge content compositionally graded SiGe/Si
-
DOI 10.1116/1.2366584
-
D. M. Isaacson, C. L. Dohrman, and E. A. Fitzgerald, J. Vac. Sci. Technol. B 1071-1023 24, 2741 (2006). 10.1116/1.2366584 (Pubitemid 44866406)
-
(2006)
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
, vol.24
, Issue.6
, pp. 2741-2747
-
-
Isaacson, D.M.1
Dohrman, C.L.2
Fitzgerald, E.A.3
-
24
-
-
28444459024
-
-
0021-8979. 10.1063/1.350803
-
F. K. Legoues, B. S. Meyerson, J. F. Morar, and P. D. Kirchner, J. Appl. Phys. 0021-8979 71, 4230 (1992). 10.1063/1.350803
-
(1992)
J. Appl. Phys.
, vol.71
, pp. 4230
-
-
Legoues, F.K.1
Meyerson, B.S.2
Morar, J.F.3
Kirchner, P.D.4
-
25
-
-
0033284270
-
Dislocation dynamics in relaxed graded composition semiconductors
-
DOI 10.1016/S0921-5107(99)00209-3
-
E. A. Fitzgerald, A. Y. Kim, M. T. Currie, T. A. Langdo, G. Taraschi, and M. T. Bulsara, Mater. Sci. Eng., B 0921-5107 67, 53 (1999). 10.1016/S0921-5107(99)00209-3 (Pubitemid 32082430)
-
(1999)
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
, vol.67
, Issue.1
, pp. 53-61
-
-
Fitzgerald, E.A.1
Kim, A.Y.2
Currie, M.T.3
Langdo, T.A.4
Taraschi, G.5
Bulsara, M.T.6
-
27
-
-
35648995872
-
Erratum: Misfit strain relaxation and dislocation formation in supercritical strained silicon on virtual substrates (Applied Physics Letters (2007) 91 (063127))
-
DOI 10.1063/1.2798244
-
J. Parsons, E. H. C. Parker, D. R. Leadley, T. J. Grasby, R. J. H. Morris, and A. D. Capewell, Appl. Phys. Lett. 0003-6951 91, 189902 (2007). 10.1063/1.2798244 (Pubitemid 350037261)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.18
, pp. 189902
-
-
Parsons, J.1
Parker, E.H.C.2
Leadley, D.R.3
Morris, R.J.H.4
Grasby, T.J.5
Capewell, A.D.6
-
28
-
-
36549104246
-
-
0021-8979. 10.1063/1.346560
-
L. B. Freund, J. Appl. Phys. 0021-8979 68, 2073 (1990). 10.1063/1.346560
-
(1990)
J. Appl. Phys.
, vol.68
, pp. 2073
-
-
Freund, L.B.1
-
29
-
-
0033878399
-
General characteristics of crack arrays in epilayers grown under tensile strain
-
DOI 10.1088/0268-1242/15/4/304
-
R. T. Murray, C. J. Kiely, and M. Hopkinson, Semicond. Sci. Technol. 0268-1242 15, 325 (2000). 10.1088/0268-1242/15/4/304 (Pubitemid 30584763)
-
(2000)
Semiconductor Science and Technology
, vol.15
, Issue.4
, pp. 325-330
-
-
Murray, R.T.1
Kiely, C.J.2
Hopkinson, M.3
-
31
-
-
0001020897
-
Thermal microcrack distribution control in GaN layers on Si substrates by lateral confined epitaxy
-
DOI 10.1063/1.1338968
-
S. Zamir, B. Meyler, and J. Salzman, Appl. Phys. Lett. 0003-6951 78, 288 (2001). 10.1063/1.1338968 (Pubitemid 33731956)
-
(2001)
Applied Physics Letters
, vol.78
, Issue.3
, pp. 288-290
-
-
Zamir, S.1
Meyler, B.2
Salzman, J.3
-
33
-
-
37749005736
-
-
0018-9383. 10.1109/TED.2007.911034
-
S. Takagi, T. Irisawa, T. Tezuka, T. Numata, S. Nakaharai, N. Hirashita, Y. Moriyama, K. Usuda, E. Toyoda, S. Dissanayake, M. Shichijo, R. Nakane, S. Sugahara, M. Takenaka, and N. Sugiyama, IEEE Trans. Electron Devices 0018-9383 55, 21 (2008). 10.1109/TED.2007.911034
-
(2008)
IEEE Trans. Electron Devices
, vol.55
, pp. 21
-
-
Takagi, S.1
Irisawa, T.2
Tezuka, T.3
Numata, T.4
Nakaharai, S.5
Hirashita, N.6
Moriyama, Y.7
Usuda, K.8
Toyoda, E.9
Dissanayake, S.10
Shichijo, M.11
Nakane, R.12
Sugahara, S.13
Takenaka, M.14
Sugiyama, N.15
-
35
-
-
0000655054
-
-
0031-9007. 10.1103/PhysRevLett.73.3447
-
K. Ismail, F. K. LeGoues, K. L. Saenger, M. Arafa, J. O. Chu, P. M. Mooney, and B. S. Meyerson, Phys. Rev. Lett. 0031-9007 73, 3447 (1994). 10.1103/PhysRevLett.73.3447
-
(1994)
Phys. Rev. Lett.
, vol.73
, pp. 3447
-
-
Ismail, K.1
Legoues, F.K.2
Saenger, K.L.3
Arafa, M.4
Chu, J.O.5
Mooney, P.M.6
Meyerson, B.S.7
-
36
-
-
0343578945
-
-
0003-6951. 10.1063/1.105351
-
E. A. Fitzgerald, Y. H. Xie, M. L. Green, D. Brasen, A. R. Kortan, J. Michel, Y. J. Mii, and B. E. Weir, Appl. Phys. Lett. 0003-6951 59, 811 (1991). 10.1063/1.105351
-
(1991)
Appl. Phys. Lett.
, vol.59
, pp. 811
-
-
Fitzgerald, E.A.1
Xie, Y.H.2
Green, M.L.3
Brasen, D.4
Kortan, A.R.5
Michel, J.6
Mii, Y.J.7
Weir, B.E.8
-
37
-
-
11044221502
-
Reduced pressure-chemical vapor deposition of intrinsic and doped Ge layers on Si(0 0 1) for microelectronics and optoelectronics purposes
-
DOI 10.1016/j.jcrysgro.2004.10.042, PII S0022024804013466
-
J. M. Hartmann, J. F. Damlencourt, Y. Bogumilowicz, P. Holliger, G. Rolland, and T. Billon, J. Cryst. Growth 0022-0248 274, 90 (2005). 10.1016/j.jcrysgro.2004.10.042 (Pubitemid 40043227)
-
(2005)
Journal of Crystal Growth
, vol.274
, Issue.1-2
, pp. 90-99
-
-
Hartmann, J.M.1
Damlencourt, J.-F.2
Bogumilowicz, Y.3
Holliger, P.4
Rolland, G.5
Billon, T.6
-
38
-
-
0342273683
-
0.1 alloy layers with low threading dislocation densities grown on low-temperature Si buffers
-
DOI 10.1063/1.121579, PII S0003695198005245
-
C. S. Peng, Z. Y. Zhao, H. Chen, J. H. Li, Y. K. Li, L. W. Guo, D. Y. Dai, Q. Huang, J. M. Zhou, Y. H. Zhang, T. T. Sheng, and C. H. Tung, Appl. Phys. Lett. 0003-6951 72, 3160 (1998). 10.1063/1.121579 (Pubitemid 128677277)
-
(1998)
Applied Physics Letters
, vol.72
, Issue.24
, pp. 3160-3162
-
-
Peng, C.S.1
Zhao, Z.Y.2
Chen, H.3
Li, J.H.4
Li, Y.K.5
Guo, L.W.6
Dai, D.Y.7
Huang, Q.8
Zhou, J.M.9
Zhang, Y.H.10
Sheng, T.T.11
Tung, C.H.12
-
40
-
-
57649096036
-
-
1882-0778. 10.1143/APEX.1.081401
-
Y. Hoshi, K. Sawano, Y. Hiraoka, Y. Satoh, Y. Ogawa, A. Yamada, N. Usami, K. Nakagawa, and Y. Shiraki, Appl. Phys. Express 1882-0778 1, 081401 (2008). 10.1143/APEX.1.081401
-
(2008)
Appl. Phys. Express
, vol.1
, pp. 081401
-
-
Hoshi, Y.1
Sawano, K.2
Hiraoka, Y.3
Satoh, Y.4
Ogawa, Y.5
Yamada, A.6
Usami, N.7
Nakagawa, K.8
Shiraki, Y.9
-
41
-
-
77950583568
-
-
R. Ionut, R. Manfred, H. Cameliu, S. Rajendra, C. Silke, and G. Ulrich, ECS Transactions 3, 317 (2006).
-
(2006)
ECS Transactions
, vol.3
, pp. 317
-
-
Ionut, R.1
Manfred, R.2
Cameliu, H.3
Rajendra, S.4
Silke, C.5
Ulrich, G.6
-
42
-
-
45049087611
-
-
(Elsevier Science, Tokyo)
-
A. O'Neill, R. Agaiby, S. Olsen, Y. Yang, P. E. Hellstrom, M. Ostling, M. Oehme, K. Lyutovich, E. Kasper, G. Eneman, P. Verheyen, R. Loo, C. Claeys, C. Fiegna, and E. Sangiorgi, Reduced Self-Heating by Strained Silicon Substrate Engineering (Elsevier Science, Tokyo, 2007), pp. 6182-6185.
-
(2007)
Reduced Self-Heating by Strained Silicon Substrate Engineering
, pp. 6182-6185
-
-
O'Neill, A.1
Agaiby, R.2
Olsen, S.3
Yang, Y.4
Hellstrom, P.E.5
Ostling, M.6
Oehme, M.7
Lyutovich, K.8
Kasper, E.9
Eneman, G.10
Verheyen, P.11
Loo, R.12
Claeys, C.13
Fiegna, C.14
Sangiorgi, E.15
-
43
-
-
33846941171
-
-
0003-6951. 10.1063/1.2472135
-
L. H. Wong, J. P. Liu, F. Romanato, C. C. Wong, and Y. L. Foo, Appl. Phys. Lett. 0003-6951 90, 061913 (2007). 10.1063/1.2472135
-
(2007)
Appl. Phys. Lett.
, vol.90
, pp. 061913
-
-
Wong, L.H.1
Liu, J.P.2
Romanato, F.3
Wong, C.C.4
Foo, Y.L.5
-
44
-
-
0000084967
-
-
1071-1023. 10.1116/1.586204
-
E. A. Fitzgerald, Y. H. Xie, D. Monroe, P. J. Silverman, J. M. Kuo, A. R. Kortan, F. A. Thiel, and B. E. Weir, J. Vac. Sci. Technol. B 1071-1023 10, 1807 (1992). 10.1116/1.586204
-
(1992)
J. Vac. Sci. Technol. B
, vol.10
, pp. 1807
-
-
Fitzgerald, E.A.1
Xie, Y.H.2
Monroe, D.3
Silverman, P.J.4
Kuo, J.M.5
Kortan, A.R.6
Thiel, F.A.7
Weir, B.E.8
-
45
-
-
36449006709
-
-
0003-6951. 10.1063/1.107569
-
J. W. P. Hsu, E. A. Fitzgerald, Y. H. Xie, P. J. Silverman, and M. J. Cardillo, Appl. Phys. Lett. 0003-6951 61, 1293 (1992). 10.1063/1.107569
-
(1992)
Appl. Phys. Lett.
, vol.61
, pp. 1293
-
-
Hsu, J.W.P.1
Fitzgerald, E.A.2
Xie, Y.H.3
Silverman, P.J.4
Cardillo, M.J.5
-
46
-
-
0029272764
-
-
0921-5107. 10.1016/0921-5107(94)09015-7
-
Y. H. Xie, E. A. Fitzgerald, and P. J. Silverman, Mater. Sci. Eng., B 0921-5107 30, 201 (1995). 10.1016/0921-5107(94)09015-7
-
(1995)
Mater. Sci. Eng., B
, vol.30
, pp. 201
-
-
Xie, Y.H.1
Fitzgerald, E.A.2
Silverman, P.J.3
-
47
-
-
84967851232
-
x layers on Si substrates by rapid thermal chemical vapor deposition
-
DOI 10.1116/1.579276
-
D. Dutartre, P. Warren, F. Provenier, F. Chollet, and A. Perio, J. Vac. Sci. Technol. A 0734-2101 12, 1009 (1994). 10.1116/1.579276 (Pubitemid 24805774)
-
(1994)
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
, vol.12
, Issue.4 PART 1
, pp. 1009
-
-
Dutartre, D.1
Warren, P.2
Provenier, F.3
Chollet, F.4
-
48
-
-
32644464066
-
Surface mobility difference between Si and Ge and its effect on growth of SiGe alloy films and Islands
-
DOI 10.1103/PhysRevLett.96.016103
-
L. Huang, F. Liu, G. H. Lu, and X. G. Gong, Phys. Rev. Lett. 0031-9007 96, 016103 (2006). 10.1103/PhysRevLett.96.016103 (Pubitemid 43248373)
-
(2006)
Physical Review Letters
, vol.96
, Issue.1
, pp. 016103
-
-
Huang, L.1
Liu, F.2
Lu, G.-H.3
Gong, X.G.4
-
49
-
-
0003542751
-
-
edited by E. Kasper (INSPEC, London)
-
R. Hull, in Properties of Strained and Relaxed Silicon Germanium, edited by, E. Kasper, (INSPEC, London, 1995), pp. 28-45.
-
(1995)
Properties of Strained and Relaxed Silicon Germanium
, pp. 28-45
-
-
Hull, R.1
-
50
-
-
0004159994
-
-
(Cambridge University Press, Cambridge). 10.1017/CBO9780511606236
-
R. Phillips, Crystals, Defects and Microstructures (Cambridge University Press, Cambridge, 2001). 10.1017/CBO9780511606236
-
(2001)
Crystals, Defects and Microstructures
-
-
Phillips, R.1
-
51
-
-
59349115370
-
-
0021-8979. 10.1063/1.3068339
-
S. Nakaharai, T. Tezuka, N. Hirashita, E. Toyoda, Y. Moriyama, N. Sugiyama, and S. Takagi, J. Appl. Phys. 0021-8979 105, 024515 (2009). 10.1063/1.3068339
-
(2009)
J. Appl. Phys.
, vol.105
, pp. 024515
-
-
Nakaharai, S.1
Tezuka, T.2
Hirashita, N.3
Toyoda, E.4
Moriyama, Y.5
Sugiyama, N.6
Takagi, S.7
-
52
-
-
0001398969
-
-
0003-6951. 10.1063/1.125187
-
H. C. Luan, D. R. Lim, K. K. Lee, K. M. Chen, J. G. Sandland, K. Wada, and L. C. Kimerling, Appl. Phys. Lett. 0003-6951 75, 2909 (1999). 10.1063/1.125187
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 2909
-
-
Luan, H.C.1
Lim, D.R.2
Lee, K.K.3
Chen, K.M.4
Sandland, J.G.5
Wada, K.6
Kimerling, L.C.7
|