Thermal microcrack distribution control in GaN layers on Si substrates by lateral confined epitaxy

Applied Physics Letters

Volumn 78, Issue 3, 2001, Pages 288-290

  Zamir, S ^a   Meyler, B ^a   Salzman, J ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001020897     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1338968     Document Type: Article

References (13)

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