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Volumn 81, Issue 7, 1997, Pages 3108-3116

Novel dislocation structure and surface morphology effects in relaxed Ge/Si-Ge(graded)/Si structures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001308387     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364345     Document Type: Article
Times cited : (187)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.