General characteristics of crack arrays in epilayers grown under tensile strain

Semiconductor Science and Technology

Volumn 15, Issue 4, 2000, Pages 325-330

  Murray, R T ^a   Kiely, C J ^a   Hopkinson, M ^b  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

TENSILE STRESS; VIBRATIONS (MECHANICAL);

TENSILE STRAINED EPILAYERS;

CRACK PROPAGATION;

EID: 0033878399     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/15/4/304     Document Type: Article

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