SCOPUS 정보 검색 플랫폼

Volumn 106, Issue 12, 2009, Pages

Optimization and calibration of atomic force microscopy sensitivity in terms of tip-sample interactions in high-order dynamic atomic force microscopy

(5) Liu, Yu a Guo, Qiuquan a Nie, Heng Yong a Lau, W M a Yang, Jun a

a UNIVERSITY OF WESTERN ONTARIO (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM CANTILEVERS; CALIBRATION METHOD; CANTILEVER STIFFNESS; CONTACT MODES; DETECTION SENSITIVITY; DYNAMIC FORCES; FLEXURAL MODES; FLEXURAL VIBRATION MODES; FORCE CONSTANTS; FORCE-DISTANCE CURVES; FUNDAMENTAL MODES; HARD SUBSTRATE; HIGH-ORDER; HIGH-ORDER DYNAMICS; INCIDENT LASER; LASER SPOTS; OPTICAL LEVER DETECTION; OPTIMAL DETECTION; PHASE IMAGING; TAPPING MODES; TIP-SAMPLE INTERACTION; TIP-SURFACE INTERACTION; VIBRATION MODES;

ATOMS; CALIBRATION; MEASUREMENT THEORY; NANOCANTILEVERS; OPTICAL MATERIALS; OPTIMIZATION; STIFFNESS; SURFACE MORPHOLOGY; VIBRATING CONVEYORS;

ATOMIC FORCE MICROSCOPY;

EID: 73849115653 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3269703 Document Type: Article

Times cited : (11)

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