Sensitivity of flexural and torsional vibration modes of atomic force microscope cantilevers to surface stiffness variations

Nanotechnology

Volumn 12, Issue 3, 2001, Pages 322-330

  Turner, J A ^a   Wiehn, J S ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MATHEMATICAL MODELS; STIFFNESS; SURFACE STRUCTURE; VIBRATIONS (MECHANICAL);

FLEXURAL VIBRATION MODE; RAYLEIGH-RITZ METHOD; SURFACE STIFFNESS VARIATION; TORSIONAL VIBRATION MODE;

NANOTECHNOLOGY;

EID: 0035442763     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/12/3/321     Document Type: Conference Paper

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