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Volumn 104, Issue 11, 2008, Pages

Revisiting atomic force microscopy force spectroscopy sensitivity for single molecule studies

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; NANOCANTILEVERS; OPTICAL PROPERTIES; PHASE INTERFACES; POLYMERIC GLASS; PRECISION BALANCES; REFRACTIVE INDEX; SENSITIVITY ANALYSIS;

EID: 58149268900     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3037206     Document Type: Article
Times cited : (5)

References (30)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.