Optimized detection of normal vibration modes of atomic force microscope cantilevers with the optical beam deflection method

Journal of Applied Physics

Volumn 97, Issue 8, 2005, Pages

  Schäffer, Tilman E ^a   Fuchs, Harald ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CONTACT MODES; MODE NUMBER; VIBRATION MODE;

ATOMIC FORCE MICROSCOPY; DEFLECTION (STRUCTURES); ELECTROMAGNETIC WAVE DIFFRACTION; IMAGING TECHNIQUES; OPTIMIZATION; PHOTODETECTORS; SURFACE PHENOMENA; VIBRATIONS (MECHANICAL);

CANTILEVER BEAMS;

EID: 21444433963     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1872202     Document Type: Article

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