Analysis of the high-frequency response of atomic force microscope cantilevers

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Rabe, U ^a   Turner, J ^a,b   Arnold, W ^a  

^a SAARLAND UNIVERSITY   (Germany)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC IMPEDANCE; ATOMIC FORCE MICROSCOPY; DEGREES OF FREEDOM (MECHANICS); DYNAMICAL SYSTEMS; FREQUENCY RESPONSE; MICROSCOPES;

ACOUSTICAL VIBRATION; ANGULAR DEFLECTION; ATOMIC FORCE MICROSCOPE CANTILEVERS; CONTACT STIFFNESS; HIGH FREQUENCY DYNAMICS; HIGH FREQUENCY RESPONSE; MATERIAL PROPERTY MEASUREMENTS; NUMERICAL TECHNIQUES;

NANOCANTILEVERS;

EID: 0346246849     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051145     Document Type: Article

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