Calibrating laser beam deflection systems for use in atomic force microscopes and cantilever sensors

Applied Physics Letters

Volumn 88, Issue 8, 2006, Pages

  Beaulieu, L Y ^a   Godin, Michel ^b   Laroche, Olivier ^c   Tabard Cossa, Vincent ^c   Grütter, Peter ^c  

^a MEMORIAL UNIVERSITY OF NEWFOUNDLAND   (Canada)

^b MIT MEDIA LAB   (United States)

^c MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER DEFLECTIONS; CANTILEVER SENSORS; LASER BEAM DETECTION; PHOTODETECTOR;

ATOMIC FORCE MICROSCOPY; LASER BEAMS; PHOTODETECTORS; SENSORS; SIGNAL PROCESSING;

CANTILEVER BEAMS;

EID: 33644530055     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2177542     Document Type: Article

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