Enhanced sensitivity to force gradients by using higher flexuralmodes of the atomic force microscope cantilever

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Hoummady, M ^a,b   Farnault, E ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPROPRIATE TECHNIQUES; ATOMIC FORCE MICROSCOPE CANTILEVERS; ENHANCED SENSITIVITY; FLEXURAL MODES; FORCE GRADIENTS; HYDRODYNAMIC INTERACTION; NON-CONTACT MODE; OPERATING FREQUENCY; RESONANT MODE; TIP-SAMPLE DISTANCE; TIP-SAMPLE INTERACTION;

ATOMIC FORCE MICROSCOPY; FREQUENCY MODULATION; NANOCANTILEVERS; SCANNING TUNNELING MICROSCOPY;

FREQUENCY RESPONSE;

EID: 0005453373     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051164     Document Type: Article

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