Higher harmonics imaging in tapping-mode atomic-force microscopy

Review of Scientific Instruments

Volumn 74, Issue 12, 2003, Pages 5111-5114

  Stark, Robert W ^a   Heckl, Wolfgang M ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BOUNDARY CONDITIONS; EIGENVALUES AND EIGENFUNCTIONS; EVAPORATION; FINITE ELEMENT METHOD; FOURIER TRANSFORMS; FREQUENCIES; FUSED SILICA; HARMONIC ANALYSIS; IMAGE ANALYSIS; NATURAL FREQUENCIES; ORDINARY DIFFERENTIAL EQUATIONS; OSCILLATIONS; PHOTODIODES; SIGNAL TO NOISE RATIO; VAN DER WAALS FORCES;

HARMONIC IMAGING; HARMONIC SIGNALS;

IMAGING TECHNIQUES;

EID: 0346306095     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1626008     Document Type: Article

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