CCD-based thermoreflectance microscopy: Principles and applications

Journal of Physics D: Applied Physics

Volumn 42, Issue 14, 2009, Pages

  Farzaneh, M ^a   Maize, K ^b   Lueren D ^c,d,h   Summers, J A ^c   Mayer, P M ^d,i   Raad, P E ^e,f   Pipe, K P ^g   Shakouri, A ^b   Ram, R J ^d   Hudgings, Janice A ^c  

^a KENYON COLLEGE   (United States)

^b University of California Santa Cruz   (United States)

^c MOUNT HOLYOKE COLLEGE   (United States)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^e Southern Methodist University   (United States)

^f TMX Scientific Inc   (United States)

^g UNIVERSITY OF MICHIGAN   (United States)

^h OXFORD GENE TECHNOLOGY   (United Kingdom)

ⁱ PHYSICAL SCIENCES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION TECHNIQUES; DEVICE SURFACES; EXPERIMENTAL SETUP; HIGH RESOLUTION; HOT SPOT DETECTION; MICRO-SCALES; NON-CONTACT; OPTICAL CHARACTERIZATION; PHYSICAL PRINCIPLES; THERMAL IMAGES; THERMAL PROFILING; THERMAL TRANSIENTS; THERMOGRAPHY TECHNIQUES; THERMOREFLECTANCE; THERMOREFLECTANCE MICROSCOPY;

DIGITAL CAMERAS; FAILURE ANALYSIS; IMAGING TECHNIQUES; OPTICAL CONDUCTIVITY; OPTOELECTRONIC DEVICES; QUALITY ASSURANCE; REMOTE SENSING; SAFETY FACTOR; SIGNAL PROCESSING; THERMOANALYSIS; THERMOGRAPHY (IMAGING); THERMOGRAPHY (TEMPERATURE MEASUREMENT);

RELIABILITY ANALYSIS;

EID: 70149114153     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/14/143001     Document Type: Article

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