Thermal profiling for optical characterization of waveguide devices

Applied Physics Letters

Volumn 83, Issue 19, 2003, Pages 3882-3884

  Hudgings, J A ^a,b   Pipe, K P ^b   Ram, R J ^b  

^a MOUNT HOLYOKE COLLEGE   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICALLY INJECTED ABSORBERS; THERMAL PROFILING;

ABSORPTION; COOLING; HEAT LOSSES; HEAT TRANSFER; LIGHT ABSORPTION; LIGHT EMISSION; MATHEMATICAL MODELS; OPTICAL WAVEGUIDES; SEMICONDUCTOR DEVICES; SURFACE MEASUREMENT; THERMAL EFFECTS; WSI CIRCUITS;

LIGHT AMPLIFIERS;

EID: 0344083503     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1625790     Document Type: Article

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