Noncontact transient temperature mapping of active electronic devices using the thermoreflectance method

IEEE Transactions on Components and Packaging Technologies

Volumn 28, Issue 4, 2005, Pages 637-643

  Burzo, Mihai G ^a   Komarov, Pavel L ^a   Raad, Peter E ^a  

^a Southern Methodist University   (United States)

Author keywords

MOSFET devices; Thermoreflectance thermometry system

Indexed keywords

LIGHT REFLECTION; MICROELECTROMECHANICAL DEVICES; SEMICONDUCTOR DEVICE STRUCTURES; SPURIOUS SIGNAL NOISE; TEMPERATURE DISTRIBUTION; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

ACTIVE ELECTRONIC DEVICES; THERMOREFLECTANCE THERMOMETRY SYSTEM; TRANSIENT TEMPERATURE MAPPING;

MOSFET DEVICES;

EID: 29244447176     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2005.859738     Document Type: Article

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