Quantitative thermal imaging by synchronous thermoreflectance with optimized illumination wavelengths

Applied Physics Letters

Volumn 78, Issue 16, 2001, Pages 2267-2269

  Tessier, G ^a   Hole S ^a   Fournier, D ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035896782     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1363696     Document Type: Article

References (7)

1. B. C. Forget, S. Grauby, D. Fournier, P. Gleyzes, and A. C. Boccara, Electron. Lett. 33, 1688 (1997).
2. T. Phan, S. Dilhaire, V. Quintard, D. Lewis, and W. Claeys, Microelectron, J. 29, 170 (1998).
3. S. Grauby, B. Brondin, C. Boué, B. C. Forget, and D. Fournier, Rev. Electr. Electron 3, 59 (1999).
4. S. Grauby, B. C. Forget, S. Holé, and D. Fournier, Rev. Sci. Instrum. 70, 3603 (1999).
5. J. Pankove, Optical Processes in Semiconductors (Dover, New York, 1976).
6. R. Abid and F. Miserey, C. R. Acad. Sci., Ser. Ilb: Mec., Phys., Chim., Astron. 319, 631 (1994).
7. V. Quintard, G. Deboy, S. Dilhaire, D. Lewis, T. Phan, and W. Claeys, Microelectron. Eng. 31, 291 (1996).