Fiber-free characterization of photonic integrated circuits by thermoreflectance microscopy

Conference on Lasers and Electro-Optics, 2007, CLEO 2007

Volumn , Issue , 2007, Pages

  Farzaneh, M ^a   Hudgings, Janice A ^a   Ram, Rajeev J ^b  

^a MOUNT HOLYOKE COLLEGE   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIED SPONTANEOUS EMISSIONS; PHOTONIC INTEGRATED CIRCUITS; THERMOREFLECTANCE; THERMOREFLECTANCE MICROSCOPY;

FIBER AMPLIFIERS; INTEGRATED CIRCUITS; INTEGRATION; LIGHT AMPLIFIERS; PHOTONIC DEVICES; SEMICONDUCTOR LASERS;

PHOTONIC INTEGRATION TECHNOLOGY;

EID: 82955246354     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CLEO.2007.4453493     Document Type: Conference Paper

References (6)

1. K. L. Hall, E. P. Ippen, and G. Eisenstein, "Bias-lead monitoring of ultrafast nonlinearities in InGaAsP diode laser amplifiers", Appl. Phys. Lett. 57, 129-131 (1990).
2. M. Farzaneh, Dietrich Lüerßen, and Janice A. Hudgings, "Thermal profiling of photonic integrated circuits by thermoreflectance microscopy", presented in Conference on Lasers and Electro-optics, Long Beach, CA, May 2006.
3. S. Grauby, B. C. Forget, S. Holé and D. Fournier, "High resolution photothermal imaging of high frequency phenomena using a visible charge coupled device camera associated with a multichannel lock-in scheme," Rev. of Sci. Instr. 70, 3603-3608 (1999).
4. Dietrich Lüerßen, Janice A. Hudgings, Peter M. Mayer, and Rajeev J. Ram, "Nanoscale thermo-reflectance microscopy with 10mK temperature resolution using stochastic resonance," presented in the 21st Semi-Therm Conference, San Jose, CA, March 2005.
5. J. A. Hudgings, K. P. Pipe and R. J. Ram, "Thermal profiling for optical characterization of waveguide devices," Appl. Phys. Lett. 83, 3882-3884 (2003).
6. K. P. Pipe and R. J. Ram, "Comprehensive heat exchange model for a semiconductor laser diode," IEEE Photon. Tech. Lett. 15, 504-506 (2003).