Experimental determination of the temperature distribution in trench-confined oxide vertical-cavity surface-emitting lasers

IEEE Journal of Quantum Electronics

Volumn 39, Issue 6, 2003, Pages 701-707

  Dabbicco, Maurizio ^a   Spagnolo, Vincenzo ^a   Ferrara, Michele ^a   Scamarcio, Gaetano ^a  

^a INFM   (Italy)

Author keywords

Electroluminescence; Micro probe spectroscopy; Temperature; Vertical cavity surface emitting lasers

Indexed keywords

ELECTROLUMINESCENCE; LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT TRANSMISSION; OPTICAL INTERCONNECTS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS;

VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

LASER APPLICATIONS;

EID: 0038605734     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2003.811600     Document Type: Article

References (22)

1. W. Nakwaski and M. Osinski, "Thermal properties of vertical-cavity surface- emitting semiconductor laser," in Progr. Opt., E. Wolf, Ed. New York: Elsevier Science, 1998, vol. 38, pp. 165-262.
2. C. Degen, I. Fischer, and W. Elsäßer, "Thermally induced local gain suppression in vertical-cavity surface-emitting lasers," Appl. Phys. Lett., vol. 76, pp. 3352-3354, June 2000.
3. T. Ackemann and M. Sondermann, "Characteristics of polarization switching from the low to the high frequency mode in vertical-cavity surface-emitting lasers," Appl. Phys. Lett., vol. 78, pp. 3574-3576, June 2001.
4. J. Kim, D. E. Pride, J. T. Boyd, and H. E. Jackson, "Spectrally-resolved near-field investigation of proton implanted vertical cavity surface emitting lasers," Appl. Phys. Lett., vol. 72, pp. 3112-3114, June 1998.
5. J. Piprek, H. Wenzel, and Q. Sztefka, "Modeling thermal effects on the light vs. current characteristics of gain-guided vertical-cavity surface-emitting lasers," IEEE Photon. Technol. Lett., vol. 6, pp. 139-142, Feb. 1994.
6. W. Nakwaski and R. P. Sarzala, "Transverse modes in gain-guided vartical-cavity surface-emitting lasers," Opt. Commun., vol. 148, pp. 63-69, Mar. 1998.
7. G. Chen, "A comparative study on the thermal characteristics of vertical-cavity surface-emitting lasers," J. Appl. Phys., vol. 77, pp. 4251-4258, May 1995.
8. B. Lu, P. Zhou, J. Cheng, K. Malloy, and J. C. Zolper, "High temperature pulsed and continuous-wave operation and thermally stable threshold characteristics of vertical-cavity surface-emitting lasers grown by met-alorganic chemical vapor deposition," Appl. Phys. Lett., vol. 65, pp. 1337-1339, Sept. 1994.
9. A. Majumdar, "Thermal microscopy and heat generation in electronic devices, microelectronics reliability," Microelectron. Reliab., vol. 38, pp. 559-565, Apr. 1998.
10. K. Luo, R. W. Herrick, A. Majumdar, and P. Petroff, "Scanning thermal microscopy of a vertical-cavity surface-emitting laser," Appl. Phys. Lett., vol. 71, pp. 1604-1606, Sept. 1997.
11. D. C. Hall, L. Goldberg, and D. Mehuys, "Technique for lateral temperature profiling in optoelectronic devices using a photoluminescence microprobe," Appl. Phys. Lett, vol. 61, pp. 384-386, July 1992.
12. V. Spagnolo, M. Troccoli, G. Scamarcio, C. Gmachl, F. Capasso, A. Tredicucci, A. M. Sergent, A. L. Hutchinson, D. L. Sivco, and A. Y. Cho, "Temperature profile of GalnAs/AlInAs/InP quantum cascade-laser facets measured by microprobe photoluminescence," Appl. Phys. Lett., vol. 78, pp. 2095-2097, Apr. 2001.
13. J. W. Tomm, E. Thamm, A. Barwolff, T. Elsaesser, J. Luft, M. Baeumler, S. Mueller, W. Jantz, I. Rechenberg, and G. Erbert, "Facet degradation of high-power diode laser arrays," Appl. Phys. A, vol. A170, pp. 377-381, Apr. 2000.
14. M. Dabbicco, V. Spagnolo, M. Ferrara, and G. Scamarcio, "Non-destructive technique for the direct measurement of the local temperature distribution in VCSEL's," in Proc. SPIE - Test and Measurement Applications of Optoelectronic Devices, vol. 4648, 2002, pp. 22-29.
15. J. A. Tamm, D. Smith, J. K. Guenter, and R. H. Johnson. (2003) High speed characteristics of VCSEL's. Online. Available: http://content.honeywell.com/vcsel/publications/tech.stm
16. M. Dabbicco, V. Spagnolo, M. Ferrara, and G. Scamarcio, "Non-destructive technique for the direct measurement of the local temperature distribution in VCSEL's," in Proc. SPIE-Vertical-Cavity Surface-Emitting Laser VI, vol. 4649, 2002, pp. 62-70.
17. R. F. M. Hendriks, M. B. Willemsen, M. P. van Exter, J. P. Woerdman, L. Weegels, K. H. Gulden, and M. Moser, "Spontaneous emission spectra of optically pumped vertical-cavity surface-emitting lasers," Opt. Commun., vol. 149, pp. 50-54, Apr. 1998.
18. M. Dabbicco, V. Spagnolo, and G. Scamarcio, "2-D temperature mapping of vertical-cavity surface-emitting lasers determined by microprobe electroluminescence," IEEE Photon. Technol. Lett., vol. 14, pp. 266-268, Mar. 2002.
19. J. Davis, Statistics and Data Analysis in Geology, 2nd ed: Wiley, 1986, p. 383.
20. V. A. Smagley, G. A. Smolyakov, P. G. Eliseev, M. Osinski, and A. J. Przekwas, "Current self-distribution effect in vertical-cavity surface-emitting semiconductor lasers," in Proc. SPIE-Physics and Simulation of Optoelectronic Devices VI, vol. 3283, 1998, pp. 171-182.
21. X. Li, T. E. Sale, and G. Knowles, "Self-consistent modeling of oxide aperture visibile vertical-cavity surface-emitting lasers," J. Mod. Opt., vol. 49, pp. 905-912, 2002.
22. J. Kim, J. T. Boyd, H. E. Jackson, and K. D. Choquette, "Near-field spectroscopy of selectively oxidized vertical cavity surface emitting lasers," Appl. Phys. Lett., vol. 76, pp. 526-528, Jan. 2000.