Temperature profiling of VCSELs by thermoreflectance microscopy

IEEE Photonics Technology Letters

Volumn 19, Issue 8, 2007, Pages 601-603

  Farzaneh, M ^a,b   Amatya, Reja ^b   Lüerßsen, Dietrich ^a,b,c   Greenberg, Kathryn J ^a   Rockwell, Whitney E ^a   Hudgings, Janice A ^a  

^a MOUNT HOLYOKE COLLEGE   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c OXFORD GENE TECHNOLOGY   (United Kingdom)

Author keywords

Temperature; Thermoreflectance; Vertical cavity surface emitting lasers (VCSELs)

Indexed keywords

DISTRIBUTED BRAGG REFLECTORS; MIRRORS; REFRACTIVE INDEX; SPONTANEOUS EMISSION; TEMPERATURE DISTRIBUTION; TEMPERATURE MEASUREMENT;

TEMPERATURE PROFILING; THERMAL LENSING; THERMOREFLECTANCE MICROSCOPY;

SURFACE EMITTING LASERS;

EID: 34147186650     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2007.894348     Document Type: Article

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