Nanoscale thermoreflectance with 10mK temperature resolution using stochastic resonance

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 2005, Pages 253-258

  Lüerßen, Dietrich ^a,b   Hudgings, Janice A ^a   Mayer, Peter M ^b   Ram, Rajeev J ^b  

^a MOUNT HOLYOKE COLLEGE   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

CCD; Microscopy; Resolution enhancement; Stochastic resonance; Temperature measurement; Thermoreflectance

Indexed keywords

RESOLUTION ENHANCEMENT; STOCHASTIC RESONANCE; THERMOREFLECTANCE; THERMOREFLECTANCE CALIBRATION;

CALIBRATION; CHARGE COUPLED DEVICES; NANOSTRUCTURED MATERIALS; OPTICAL RESOLVING POWER; RESONANCE; TEMPERATURE MEASUREMENT; THERMOANALYSIS;

REFLECTION;

EID: 28144442452     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/STHERM.2005.1412188     Document Type: Conference Paper

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