Transient thermal imaging using thermoreflectance

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 2008, Pages 55-58

  Maize, K ^a   Christofferson, J ^a   Shakouri, A ^a  

^a University of California Santa Cruz   (United States)

Author keywords

Temperature; Thermal; Thermoflectance imaging; Transcient

Indexed keywords

LOCK-IN; TEMPERATURE; THERMAL; THERMOFLECTANCE IMAGING; TRANSCIENT;

CHARGE COUPLED DEVICES; DIGITAL CAMERAS; ELECTRIC CONDUCTIVITY; INTEGRATED CIRCUITS; OPTOELECTRONIC DEVICES; SIGNAL PROCESSING; THERMAL VARIABLES MEASUREMENT; TIME SERIES ANALYSIS;

IMAGE ENHANCEMENT;

EID: 51349120291     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/STHERM.2008.4509366     Document Type: Conference Paper

References (13)

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