Comprehensive heat exchange model for a semiconductor laser diode

IEEE Photonics Technology Letters

Volumn 15, Issue 4, 2003, Pages 504-506

  Pipe, K P ^a   Ram, R J ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Integrated optoelectronics; Laser thermal factors; Lasers; Nondestructive testing; Semiconductor device testing; Semiconductor device thermal factors; Semiconductor lasers; Thermal variables measurement

Indexed keywords

HEAT CONDUCTION; HEAT CONVECTION; HEAT RADIATION; HEAT TRANSFER COEFFICIENTS; INTEGRATED OPTOELECTRONICS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING; THERMAL VARIABLES MEASUREMENT;

HEAT EXCHANGE MODEL; LASER THERMAL FACTORS; THERMAL PROBING;

SEMICONDUCTOR LASERS;

EID: 0037390895     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2003.809308     Document Type: Article

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