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1
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33750143841
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Coupling Surface Temperature Scanning and Ultra-Fast Adaptive Computing to Thermally Fully Characterize Complex Three-Dimensional Electronic Devices
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Dallas, Texas, March 14-16
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P. E. Raad, P.L. Komarov, and M. G. Burzo, "Coupling Surface Temperature Scanning and Ultra-Fast Adaptive Computing to Thermally Fully Characterize Complex Three-Dimensional Electronic Devices," 22nd Semiconductor Thermal Measurement, Modeling, and Management Symposium (SEMITHERM), Dallas, Texas, March 14-16, 2006.
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(2006)
22nd Semiconductor Thermal Measurement, Modeling, and Management Symposium (SEMITHERM)
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Raad, P.E.1
Komarov, P.L.2
Burzo, M.G.3
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2
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0032071599
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Short-time-scale Thermal Mapping of Microdevices using a Scanning Thermoreflectance Technique
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K. E. Goodson and Y. S. Ju, "Short-time-scale Thermal Mapping of Microdevices using a Scanning Thermoreflectance Technique," ASME J. of Heat Transfer, Vol. 120, pp. 306-313, 1998.
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(1998)
ASME J. of Heat Transfer
, vol.120
, pp. 306-313
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Goodson, K.E.1
Ju, Y.S.2
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3
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0032606243
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High Resolution Photothermal Imaging of High Frequency Using Visible Charge Couple Device Camera Associated with Multichannel Lock-in Scheme
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S. Grauby, S. Hole, and D. Fournier, "High Resolution Photothermal Imaging of High Frequency Using Visible Charge Couple Device Camera Associated with Multichannel Lock-in Scheme," Review of Scientific Instruments, pp. 3603-3608, 1999.
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(1999)
Review of Scientific Instruments
, pp. 3603-3608
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Grauby, S.1
Hole, S.2
Fournier, D.3
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4
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84907687402
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Quantitative thermoreflectance imaging: Calibration method and validation on a dedicated integrated circuit
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Belgirate, Lake Maggiore, Italy, 27-30 September
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G. Tessier, S. Pavageau, B. Charlot, C. Filloy, D. Fournier, B. Cretin, S. Dilhaire, S. Gomez, N. Trannoy, P. Vairac, and S. Volz, "Quantitative thermoreflectance imaging: calibration method and validation on a dedicated integrated circuit," 11th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Belgirate, Lake Maggiore, Italy, 27-30 September 2005.
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(2005)
11th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
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Tessier, G.1
Pavageau, S.2
Charlot, B.3
Filloy, C.4
Fournier, D.5
Cretin, B.6
Dilhaire, S.7
Gomez, S.8
Trannoy, N.9
Vairac, P.10
Volz, S.11
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5
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34548090663
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Qualitative temperature variation imaging by thermoreflectance and SThM techniques
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Belgirate, Lake Maggiore, Italy, 27, 30 September
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S. Grauby, A. Salhi, L.-D. Patino Lopez, S. Dilhaire, B. Charlot, W. Claeys, B. Cretin, S. Gomès, G. Tessier, N. Trannoy, P. Vairac, and S. Volz, "Qualitative temperature variation imaging by thermoreflectance and SThM techniques," 11th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Belgirate, Lake Maggiore, Italy, 27 - 30 September 2005.
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(2005)
11th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
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Grauby, S.1
Salhi, A.2
Patino Lopez, L.-D.3
Dilhaire, S.4
Charlot, B.5
Claeys, W.6
Cretin, B.7
Gomès, S.8
Tessier, G.9
Trannoy, N.10
Vairac, P.11
Volz, S.12
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6
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0038819132
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Thermal Transport Properties of Gold-Covered Thin-Film Silicon Dioxide
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M. G. Burzo, P.L. Komarov, and P. E. Raad, "Thermal Transport Properties of Gold-Covered Thin-Film Silicon Dioxide", IEEE Transactions on Components and Packaging Technologies, Vol. 26(1), pp. 80-88, 2003.
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(2003)
IEEE Transactions on Components and Packaging Technologies
, vol.26
, Issue.1
, pp. 80-88
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Burzo, M.G.1
Komarov, P.L.2
Raad, P.E.3
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7
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0242406724
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Transient thermo-reflectance measurements of thermal conductivity and interface resistance of metallized natural and isotopically-pure silicon
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P. L. Komarov, M. G. Burzo, G. Kaytaz, and P. E Raad, "Transient thermo-reflectance measurements of thermal conductivity and interface resistance of metallized natural and isotopically-pure silicon," Microelectronics Journal, Vol. 34, pp. 1115-1118, 2003.
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(2003)
Microelectronics Journal
, vol.34
, pp. 1115-1118
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Komarov, P.L.1
Burzo, M.G.2
Kaytaz, G.3
Raad, P.E.4
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8
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32844463053
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Thermal Characterization Of Pulse-Activated Microelectronic Devices By Thermoreflectance-Based Surface Temperature Scanning
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July 17-22, San Francisco, CA
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P. L. Komarov, M. G. Burzo, G. Kaytaz, and P. E Raad, "Thermal Characterization Of Pulse-Activated Microelectronic Devices By Thermoreflectance-Based Surface Temperature Scanning," The Pacific Rim/ASME International Electronic Packaging Technical Conference and Exhibition (InterPACK'05), July 17-22, 2005, San Francisco, CA.
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(2005)
The Pacific Rim/ASME International Electronic Packaging Technical Conference and Exhibition (InterPACK'05)
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Komarov, P.L.1
Burzo, M.G.2
Kaytaz, G.3
Raad, P.E.4
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9
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4243622996
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System and Method for Predicting the Behavior of a Component,
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US Patent No. 6,064,810, issued May 16, 2000
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P. E. Raad, J. S. Wilson and D. C. Price, "System and Method for Predicting the Behavior of a Component," US Patent No. 6,064,810, issued May 16, 2000.
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Raad, P.E.1
Wilson, J.S.2
Price, D.C.3
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10
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2942711363
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A Transient Self-Adaptive Technique for Modeling Thermal Problems with Large Variations in Physical Scales
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J. S. Wilson and P. E. Raad, "A Transient Self-Adaptive Technique for Modeling Thermal Problems with Large Variations in Physical Scales," International Journal of Heat and Mass Transfer, Vol. 47, pp. 3707-3720, 2004.
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(2004)
International Journal of Heat and Mass Transfer
, vol.47
, pp. 3707-3720
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Wilson, J.S.1
Raad, P.E.2
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11
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0036967257
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A Study of the Effect of Surface Metallization on Thermal Conductivity Measurements by the Transient Thermo-Reflectance Method
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M. G. Burzo, P.L. Komarov, and P. E. Raad, "A Study of the Effect of Surface Metallization on Thermal Conductivity Measurements by the Transient Thermo-Reflectance Method," ASME Journal of Heat Transfer, Vol. 124, pp. 1009-1018, 2002.
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(2002)
ASME Journal of Heat Transfer
, vol.124
, pp. 1009-1018
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Burzo, M.G.1
Komarov, P.L.2
Raad, P.E.3
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12
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2442530785
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Performance Analysis of the Transient Thermo-Reflectance Method for Measuring the Thermal Conductivity of Single Layer Materials
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P. L. Komarov and P. E. Raad, "Performance Analysis of the Transient Thermo-Reflectance Method for Measuring the Thermal Conductivity of Single Layer Materials," International Journal of Heat and Mass Transfer, Vol. 47, pp. 3233-3244, 2004.
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(2004)
International Journal of Heat and Mass Transfer
, vol.47
, pp. 3233-3244
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Komarov, P.L.1
Raad, P.E.2
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