Quantifying optical feedback into semiconductor lasers via thermal profiling

IEEE Photonics Technology Letters

Volumn 18, Issue 2, 2006, Pages 310-312

  Kapusta, Evelyn W ^b   Lüerßen, Dietrich ^b,c   Hudgings, Janice A ^a,b  

^a IEEE

^b MOUNT HOLYOKE COLLEGE   (United States)

^c OXFORD GENE TECHNOLOGY   (United Kingdom)

Author keywords

Integrated optics; Optical feedback; Photothermal effects; Semiconductor device thermal factors; Semiconductor lasers

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRONICS INDUSTRY; HETEROJUNCTIONS; INTEGRATED CIRCUITS; INTEGRATED OPTOELECTRONICS; LASERS; SEMICONDUCTOR LASERS; SEMICONDUCTOR MATERIALS; THERMAL VARIABLES MEASUREMENT;

FEEDBACK COUPLING; INTEGRATED OPTICS; OPTICAL ACCESSES; OPTICAL FEEDBACK; OPTICAL MEASUREMENTS; OPTICAL OUTPUT POWER; OPTICAL-; PHOTONIC INTEGRATED CIRCUITS; PHOTOTHERMAL EFFECTS; QUANTITATIVE DETERMINATIONS; SEMICONDUCTOR DEVICE THERMAL FACTORS; THRESHOLD CURRENTS;

FEEDBACK;

EID: 48849099997     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2005.861967     Document Type: Article

References (11)

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