Architecting a Reliable CMP Switch Architecture

ACM Transactions on Architecture and Code Optimization

Volumn 4, Issue 1, 2007, Pages 2-

  Constantinides, Kypros ^a   Plaza, Stephen ^a   Blome, Jason ^a   Bertacco, Valeria ^a   Mahlke, Scott ^a   Austin, Todd ^a   Zhang, Bin ^b   Orshansky, Michael ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b The University of Texas at Austin   (United States)

Author keywords

CMP switch; defect tolerance; Design; Reliability; reliability

Indexed keywords

EID: 67649634851     PISSN: 15443566     EISSN: 15443973     Source Type: Journal    
DOI: 10.1145/1216544.1216545     Document Type: Article

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