The impact of technology scaling on lifetime reliability

Proceedings of the International Conference on Dependable Systems and Networks

Volumn , Issue , 2004, Pages 177-186

  Srinivasan, Jayanth ^a   Adve, Sarita V ^a   Bose, Pradip ^b   Rivers, Jude A ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; FAILURE (MECHANICAL); MATHEMATICAL MODELS; RELIABILITY; THERMAL CYCLING; TRANSISTORS;

MICROARCHITECTURE; TIME-DEPENDENT DIELECTRIC BREAKDOWN (TDDB); VOLTAGE SCALING;

CMOS INTEGRATED CIRCUITS;

EID: 4544227478     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/dsn.2004.1311888     Document Type: Conference Paper

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