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Physical Review Letters

Volumn 96, Issue 1, 2006, Pages

Atomic-scale sharpening of silicon tips in noncontact atomic force microscopy

(4) Caciuc, V a Holscher H a Blugel S b Fuchs, H a

a UNIVERSITY OF MÜNSTER (Germany)

b FORSCHUNGSZENTRUM JÜLICH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; IMAGING TECHNIQUES; PROBABILITY DENSITY FUNCTION; STABILITY;

ATOMIC-SCALE SHARPENING; CHEMICAL FORCES; SILICON TIPS;

SILICON;

EID: 32644476667 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.96.016101 Document Type: Article

Times cited : (13)

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