Fermi level determination in organic thin films by the Kelvin probe method

Journal of Applied Physics

Volumn 80, Issue 12, 1996, Pages 6880-6883

  Pfeiffer, M ^a   Leo, K ^a   Karl, N ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005233162     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363757     Document Type: Article

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