Influence of molecular order on the local work function of nanographene architectures: A Kelvin-probe force microscopy study

ChemPhysChem

Volumn 6, Issue 11, 2005, Pages 2371-2375

  Palermo, Vincenzo ^a   Palma, Matteo ^a,e   Tomović, Željko ^b   Watson, Mark D ^b,c   Friedlein, Rainer ^d   Müllen, Klaus ^b   Samorì, Paolo ^a,e  

^a Istituto Per La Sintesi Organica E La Fotoreattività   (Italy)

^b MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^c UNIVERSITY OF KENTUCKY   (United States)

^d LINKÖPING UNIVERSITY   (Sweden)

^e UNIVERSITÉ LOUIS PASTEUR   (France)

Author keywords

Conjugation; Kelvin probe force microscopy; Organic electronics; Thin films; Work function

Indexed keywords

ELECTRONIC PROPERTIES; MICA; MOLECULAR ORIENTATION; MOLECULES; NANOSTRUCTURES; NETWORK ARCHITECTURE; NETWORK LAYERS; PROBES; THIN FILMS; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; WORK FUNCTION;

CONJUGATION; KELVIN PROBE FORCE MICROSCOPY; MOLECULAR PACKING DENSITY; ORGANIC ELECTRONIC DEVICES; ORGANIC ELECTRONICS; ORGANIC NANOSTRUCTURES; STRUCTURAL AND ELECTRONIC PROPERTIES; SUPRAMOLECULAR ARCHITECTURES;

FIELD EFFECT TRANSISTORS;

EID: 27844466022     PISSN: 14394235     EISSN: None     Source Type: Journal    
DOI: 10.1002/cphc.200500181     Document Type: Article

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