Modeling of transport in polycrystalline organic semiconductor films

Applied Physics Letters

Volumn 82, Issue 5, 2003, Pages 745-747

  Verlaak, S ^a,b   Arkhipov, V ^a   Heremans, P ^a,b  

^a IMEC   (Belgium)

^b Katholieke Universiteit Leuven   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MOBILITY; ELECTRON TRANSPORT PROPERTIES; GRAIN BOUNDARIES; HYDROCARBONS; INTERFACIAL ENERGY; POLYCRYSTALLINE MATERIALS; SEMICONDUCTOR DOPING; THIN FILMS; THRESHOLD VOLTAGE;

ORGANIC SEMICONDUCTOR FILMS;

SEMICONDUCTING FILMS;

EID: 0037415917     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1541112     Document Type: Article

References (12)

1. Y. Y. Lin, D. J. Gundlach, S. F. Nelson, and T. N. Jackson, IEEE Trans. Electron Devices 44, 1325 (1997).
2. R. A. Street, D. Knipp, and A. R. Vökel, Appl. Phys. Lett. 80, 1658 (2002).
3. J. Levinson, F. R. Shepherd, P. J. Scanlon, W. D. Westwood, G. Este, and M. Rider, J. Appl. Phys. 53, 1193 (1982).
4. E. A. Silinsh, Organic Molecular Crystals (Springer, Berlin, 1980), pp. 139-220.
5. J. W. Orton and M. J. Powell, Rep. Prog. Phys. 43, 1265 (1980).
6. G. Baccarani, B. Ricco, and G. Spadini, J. Appl. Phys. 49, 5565 (1978).
7. G. Horowitz, M. E. Hajlaoui, and R. Hajlaoui, J. Appl. Phys. 87, 4456 (2000).
8. J. H. Schön and B. Batlogg, Appl. Phys. Lett. 74, 260 (1999).
9. H. Nussbaumer, F. P. Baumgartner, G. Willeke, and E. Bucher, J. Appl. Phys. 83, 292 (1998).
10. Comparison between morphologies was made using atomic force microscopy.
11. G. Horowitz and M. E. Hajlaoui, Adv. Mater. 12, 1046 (2000).
12. S. E. Esipov, Phys. Rev. B 44, 7930 (1991).