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Volumn 146, Issue 3, 2004, Pages 297-309

A microscopic view of charge transport in polymer transistors

Author keywords

Charge transport; Polymer transistors; TFB

Indexed keywords

CARRIER CONCENTRATION; CHARGE TRANSFER; DIELECTRIC MATERIALS; ELECTRON MOBILITY; FLUORINE CONTAINING POLYMERS; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; NEMATIC LIQUID CRYSTALS; SEMICONDUCTING POLYMERS;

EID: 9344230403     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2004.08.009     Document Type: Conference Paper
Times cited : (83)

References (42)
  • 1
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    • V.C. Sundar, et al., Science 303 (2004) 1644.
    • (2004) Science , vol.303 , pp. 1644
    • Sundar, V.C.1
  • 11
    • 9344258465 scopus 로고    scopus 로고
    • note
    • SCM-PIT from Digital Instruments or NSC14/Cr-Au from Mikro-Masch.
  • 12
  • 16
    • 9344224408 scopus 로고    scopus 로고
    • note
    • s [17] associated with the band-bending in the accumulation layer is not accessible to SKPM since it is compensated by an equal shift in workfunction of the conducting layer.
  • 25
    • 0034598733 scopus 로고    scopus 로고
    • B. Crone, et al., Nature 403 (2000) 521.
    • (2000) Nature , vol.403 , pp. 521
    • Crone, B.1
  • 26
    • 9344230215 scopus 로고    scopus 로고
    • note
    • Note that Eq. (15) is valid only in the linear regime of transistor operation.
  • 28
    • 9344259569 scopus 로고    scopus 로고
    • note
    • The experiments were actually conducted on two-terminal field-effect devices where source and drain electrodes were connected at the channel edges. For details we refer to Ref. [17].
  • 35
    • 0033348792 scopus 로고    scopus 로고
    • P. Stalinga, et al., Physcia B 273-274 (1999) 923.
    • (1999) Physcia B , vol.273-274 , pp. 923
    • Stalinga, P.1
  • 39
    • 9344242244 scopus 로고    scopus 로고
    • note
    • g| ≥ 50V they are due to the fact that the trap states are being filled already during the forward sweep.
  • 40
    • 9344229112 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Cambridge
    • R.J. Wilson, Ph.D. Thesis, University of Cambridge, 2002.
    • (2002)
    • Wilson, R.J.1
  • 41
    • 9344269269 scopus 로고    scopus 로고
    • note
    • 1/2 is not the actual half-life of the density of trapped charges but serves as a qualitative measure of the time-scale associated with the release only.
  • 42
    • 9344240312 scopus 로고    scopus 로고
    • note
    • Where the polymer is (was) subject to bias-stress, i.e. in the accumulation region, which extends (extended) over about 1 nm.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.