Subsurface raman imaging with nanoscale resolution

Nano Letters

Volumn 6, Issue 4, 2006, Pages 744-749

  Anderson, Neil ^a   Anger, Pascal ^a   Hartschuh, Achim ^b   Novotny, Lukas ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

^b UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MEDIA; NANOSCALE RESOLUTION; SUBSURFACE RAMAN IMAGING;

CARBON NANOTUBES; DIELECTRIC MATERIALS; NANOTECHNOLOGY; OPTICAL RESOLVING POWER; RAMAN SPECTROSCOPY;

IMAGING TECHNIQUES;

CARBON NANOTUBE;

ARTICLE; CHEMISTRY; EVALUATION; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; RAMAN SPECTROMETRY; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTY; TRANSDUCER; ULTRASTRUCTURE;

MATERIALS TESTING; NANOTECHNOLOGY; NANOTUBES, CARBON; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES; TRANSDUCERS;

EID: 33646396773     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0600023     Document Type: Article

References (23)

1. International Technology Roadmap for Semiconductors (http://public.itrs. net)
2. Ippolito, S. B.; Thorne, S. A.; Eraslan, M. G.; Leblebici, Y.; Goldberg, B. B.; Unlu, M. S. Appl. Phys. Lett. 2004, 84, 4529-4531.
3. Sykes, E. C. H.; Fernández-Torres, L. C.; Nanayakkara, S. U.; Mantooth, B. A.; Nevin, R. M.; Weiss, P. S. Proc. Natl. Acad. Sci., in press.
4. Shekhawat, G. S.; Dravid, V. P. Science 2005, 310, 89-92.
5. Taubner, T.; Keilmann, F.; Hillenbrand, R. Opt. Exp. 2005, 13, 8893-8899.
6. Ramsay, E.; Pleynet, N.; Xiao, D.; Warburton, R. J.; Reid, D. T. Opt. Lett. 2005, 30, 26-28.
7. Hartschuh, A.; Sánchez, E. J.; Xie, X. S.; Novotny, L. Phys. Rev. Lett. 2003, 90, 095503.
8. Stöckle, R. M.; Suh, Y. D.; Deckert, V.; Zenobi, R. Chem. Phys. Lett. 2000, 318, 131-136.
9. Hayazawa, N.; Inouye, Y.; Sekkat, Z.; Kawata, S. Chem. Phys. Lett. 2001, 335, 369-374.
10. Pettinger, B.; Ren, B.; Picardi, G.; Schuster, R.; Ertl, G. Phys. Rev. Lett. 2004, 92, 096101.
11. Anderson, N.; Hartschuh, A.; Cronin, S. Novotny, L. J. Am. Chem. Soc. 2005, 127, 2533-2537.
12. Anderson, N.; Hartschuh, A.; Novotny, L. Mater. Today 2005, 50-54.
13. Hartschuh, A.; Qian, H.; Meixner, A. J.; Anderson, N.; Novotny, L. Nano Lett. 2005, 5, 2310.
14. Novotny, L.; Bian, R. X.; Xic, X. S. Phys. Rev. Lett. 1997, 79, 000645.
15. Dresselhaus, M. S.; Dresselhaus, G.; Saito, R.; Jorio, A. Phys. Rep. 2005, 409, 47-99.
16. Hafner, C. The Generalized Multiple Multipole Technique for Computational Electromagnetics; Artech: Boston, MA, 1986.
17. Karrai, K.; Grober, R. D. Appl. Phys. Lett. 1995, 66, 1842-1844.
18. Hartschuh, A.; Anderson, N.; Novotny, L. J. Microsc. 2003, 210, 234-240.
19. Fischer, U. Ch.; Zingsheim, H. P. J. Vac. Sci. Technol. 1981, 19, 881-885.
20. Novotny, L.; Hecht, B. Principles of Nano-Optics; Cambridge University Press: Cambridge, 2006.
21. Notingher, I.; Elfick, A. J. Chem. Phys. B 2005, 109, 15699.
22. Festy, F.; Demming, A.; Richards, D. Ultramicroscopy 2004, 100, 437-441.
23. Gerton, J. M.; Wade, L. A.; Lessard, G. A.; Ma, Z.; Quake, S. R. Phys. Rev. Lett. 2004, 93, 180801.