Imaging with reflection near-field optical microscope: Contributions of middle and far fields

Optics Communications

Volumn 130, Issue 4-6, 1996, Pages 337-347

  Xiao, Mufei ^a,c   Bozhevolnyi, Sergey ^b  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b AALBORG UNIVERSITY   (Denmark)

^c Institute of Physics UNAM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTS; NUMERICAL ANALYSIS; OPTICAL MICROSCOPY; REFLECTION; SIMULATION;

IMAGING PROPERTIES; NEAR-FIELD OPTICAL MICROSCOPE; OPTICAL SIGNAL;

IMAGE PROCESSING;

EID: 0030271052     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/0030-4018(96)00291-X     Document Type: Article

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