Apertureless scanning near-field infrared microscopy of a rough polymeric surface

Langmuir

Volumn 17, Issue 9, 2001, Pages 2774-2781

  Akhremitchev, Boris B ^a   Pollack, Steven ^b   Walker, Gilbert C ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

^b HOWARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ATTENUATION; DIELECTRIC MATERIALS; FINITE DIFFERENCE METHOD; IMAGING TECHNIQUES; LIGHT SCATTERING; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PLASTIC FILMS; SEMICONDUCTOR MATERIALS; SURFACE ROUGHNESS; TIME DOMAIN ANALYSIS;

INFRARED NEAR FIELD MICROSCOPY;

COPOLYMERS;

EID: 0035353377     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la001401v     Document Type: Article

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