Simulation of optical near and far fields of dielectric apertureless scanning probes

Nanotechnology

Volumn 17, Issue 2, 2006, Pages 475-482

  Esteban, R ^a   Vogelgesang, R ^a   Kern, K ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; MAXWELL EQUATIONS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; SCANNING;

BEAM EXCITATION; CONICAL SILICON TIPS; OPTICAL PROBES; TIP APEX RADIUS;

PROBES;

EID: 32644438872     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/17/2/022     Document Type: Article

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