Probing photonic and optoelectronic structures by apertureless scanning near-field optical microscopy

Microscopy Research and Technique

Volumn 64, Issue 5-6, 2004, Pages 441-452

  Bachelot, Renaud ^a   Lerondel, Gilles ^a   Blaize, Sylvain ^a   Aubert, Sebastien ^a   Bruyant, Aurelien ^a   Royer, Pascal ^a  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

Apertureless; Integrated optics; Near field optics; NSOM; Optoelectronics; Photonic structure; Scanning near field optical microscopy and spectroscopy; Semiconductor lasers; SNOM; Waveguide

Indexed keywords

INTEGRATED OPTICS; ION EXCHANGE; OPTICAL DATA STORAGE; OPTICAL WAVEGUIDES; OPTOELECTRONIC DEVICES; SEMICONDUCTOR JUNCTIONS; SEMICONDUCTOR LASERS;

APERTURELESS; APERTURELESS SCANNING; NEAR FIELD OPTICS; NEAR-FIELD OPTICAL SPECTROSCOPY; OPTICAL NEAR FIELD; OPTO-ELECTRONIC STRUCTURES; PHOTONIC STRUCTURE; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY; SCANNING OPTICAL;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ION CHANNEL;

APERTURELESS SCANNING NEAR FIELD OPTICAL MICROSCOPY; IMAGE QUALITY; ION EXCHANGE; LASER; MATHEMATICAL ANALYSIS; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; REVIEW; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SEMICONDUCTOR; STRUCTURE ANALYSIS;

EID: 9644266690     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/jemt.20102     Document Type: Review

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