Artifact-free near-field optical imaging by apertureless microscopy

Applied Physics Letters

Volumn 77, Issue 5, 2000, Pages 621-623

  Labardi, M ^a   Patane S ^b   Allegrini, M ^a,b  

^a INFM   (Italy)

^b UNIVERSITY OF MESSINA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000375263     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.127064     Document Type: Article

References (16)

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