Direct near-field optical imaging of higher order plasmonic resonances

Nano Letters

Volumn 8, Issue 10, 2008, Pages 3155-3159

  Esteban, R ^a   Vogelgesang, R ^a   Dorfmuller J ^a   Dmitriev, A ^b   Rockstuhl, C ^c   Etrich, C ^c   Kern, K ^a,d  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^c FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^d EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; SURFACE PLASMON RESONANCE;

AMBIENT CONDITIONS; APERTURELESS SCANNING; HIGH FIDELITIES; HIGHER ORDERS; IN-SITU; LOCALIZED SURFACE PLASMONS; NEAR FIELDS; NEAR-FIELD OPTICAL IMAGING; OPTICAL INFORMATIONS; POLARIZATION CONTROLS; REAL SPACES; RESONANT STRUCTURES; ROUTINE METHODS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

NANOPARTICLE;

ARTICLE; CHEMISTRY; ELECTRON MICROSCOPY; EQUIPMENT DESIGN; METHODOLOGY; MICROSCOPY; NANOTECHNOLOGY; OPTICS; SCANNING PROBE MICROSCOPY; SURFACE PLASMON RESONANCE; SURFACE PROPERTY;

EQUIPMENT DESIGN; MICROSCOPY; MICROSCOPY, ELECTRON; MICROSCOPY, SCANNING PROBE; NANOPARTICLES; NANOTECHNOLOGY; OPTICS; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES;

EID: 56149107011     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl801396r     Document Type: Article

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