Apertureless scanning near field optical microscope with sub- 10 nm resolution

Review of Scientific Instruments

Volumn 77, Issue 4, 2006, Pages

  Bek, Alpan ^a,b   Vogelgesang, Ralf ^a   Kern, Klaus ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE QUALITY; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL PROPERTIES; TRANSPARENCY;

ARTIFACT MECHANISMS; NEAR FIELD OPTICAL CONTRAST; SCANNING PROBE MICROSCOPES (SPM);

MICROSCOPES;

EID: 33646407842     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2190211     Document Type: Article

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