Definition of a simple resolution criterion in an apertureless scanning near-field optical microscope (A-SNOM): Contribution of the tip vibration and lock-in detection

EPJ Applied Physics

Volumn 26, Issue 1, 2004, Pages 45-52

  Bijeon, J L ^a   Adam, P M ^a   Barchiesi, D ^a   Royer, P ^a  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEMODULATION; LIGHT SCATTERING; MATHEMATICAL MODELS; PROBES; RAYLEIGH SCATTERING; VIBRATIONS (MECHANICAL);

APERTURELESS SCANNING NEAR FIELD OPTICAL MICROSCOPE; LIGHT CONFINEMENT; LOCK IN DETECTION;

OPTICAL MICROSCOPY;

EID: 1842832837     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2004021     Document Type: Article

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