Pure optical contrast in scattering-type scanning near-field microscopy

Journal of Microscopy

Volumn 202, Issue 1, 2001, Pages 77-83

  Hillenbrand, R ^a   Knoll, B ^a   Keilmann, F ^a  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

Author keywords

Apertureless SNOM; Phase contrast; Scanning microscopy

Indexed keywords

MICROSCOPES;

APERTURELESS SNOM; HIGHER HARMONICS; INTERFEROMETRIC DETECTION; NEAR FIELDS; OPTICAL CONTRAST; PHASE-CONTRAST; SCANNING MICROSCOPY; SCANNING NEAR FIELD MICROSCOPY; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SCATTERED SIGNALS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

AMPLITUDE MODULATION; ARTIFACT; CONFERENCE PAPER; IMAGE DISPLAY; LIGHT SCATTERING; MICROSCOPE IMAGE; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; TECHNIQUE;

EID: 0035061904     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00794.x     Document Type: Conference Paper

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