Constant voltage stress induced current in Ta2O5 stacks and its dependence on a gate electrode

Semiconductor Science and Technology

Volumn 23, Issue 7, 2008, Pages

  Atanassova, E ^a   Stojadinovic, N ^b   Paskaleva, A ^a   Spassov, D ^a   Vracar, L ^b   Georgieva, M ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

^b UNIVERSITY OF NI   (Serbia)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTANT VOLTAGE STRESS (CVS);

TANTALUM;

EID: 47749152260     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/23/7/075017     Document Type: Article

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