Characterization and modeling of high-frequency noise in MOSFETs for RF IC design

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5470, Issue , 2004, Pages 49-60

  Chen, Chih Hung ^a   Asgaran, Saman ^a   Li, Feng ^a   Deen, M Jamal ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

Channel Noise; Correlation Noise; High Frequency Noise Characterization; High Frequency Noise Modeling; Induced Gate Noise; MOSFETs; RF Noise

Indexed keywords

INTEGRATED CIRCUITS; MATHEMATICAL MODELS; MOSFET DEVICES; NATURAL FREQUENCIES; OPTIMIZATION; PARAMETER ESTIMATION; SIGNAL PROCESSING;

CHANNEL NOISES; CORRELATION NOISES; HIGH-FREQUENCY NOISE CHARACTERIZATION; HIGH-FREQUENCY NOISE MODELING; INDUCED GATE NOISES; RF NOISES;

SPURIOUS SIGNAL NOISE;

EID: 4344597245     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.547190     Document Type: Conference Paper

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