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Volumn , Issue , 1999, Pages 34-39
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Impact of noise parameter de-embedding on the high-frequency noise modeling of MOSFETs
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Author keywords
[No Author keywords available]
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Indexed keywords
MATHEMATICAL MODELS;
OPTIMIZATION;
SIGNAL NOISE MEASUREMENT;
SPURIOUS SIGNAL NOISE;
NOISE PARAMETER DE-EMBEDDING;
MOSFET DEVICES;
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EID: 0032678050
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (16)
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References (15)
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