Thermal channel noise of quarter and sub-quarter micron NMOS FET's

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2000, Pages 95-98

  Knoblinger, Gerhard ^a   Klein, Peter ^a   Baumann, Uwe ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; COMPUTER SIMULATION; ELECTRIC RESISTANCE MEASUREMENT; EQUIVALENT CIRCUITS; MATHEMATICAL MODELS; RESISTORS; SCATTERING PARAMETERS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DEVICE TESTING; SPURIOUS SIGNAL NOISE; THERMAL EFFECTS;

CHANNEL NOISE CONTRIBUTION; LONG CHANNEL THEORY; SHORT CHANNEL TRANSISTOR; SUBQUARTER MICRON TECHNOLOGY; THERMAL CHANNEL NOISE;

MOSFET DEVICES;

EID: 0033708323     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)